The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[20p-221C-1~15] 15.6 Group IV Compound Semiconductors (SiC)

Thu. Sep 20, 2018 1:45 PM - 6:00 PM 221C (2F_Lounge1)

Shin-Ichiro Kuroki(Hiroshima Univ.), Kazuma Eto(AIST)

5:30 PM - 5:45 PM

[20p-221C-14] Corrosion resistance of AlN to chlorine trifluoride gas for SiC etching

Miyu Haruguchi1, Ryohei Kawasaki1, Hitoshi Habuka1, Takahashi Yoshinao2 (1.Yokohama Nat. Univ, 2.Kanto Denka Kogyo)

Keywords:Chlorine trifluoride gas, etching, ALN

In order to protect components inside the etching equipment from corrosion due to high reactivity of chlorine trifluoride gas for rapidly processing the surface of silicon carbide in the semiconductor manufacturing process, it is assumed that the protective film material against chlorine trifluoride gas is used, The corrosion resistance was investigated and the details are reported.