The 65h JSAP Spring Meeting, 2018

Presentation information

Poster presentation

13 Semiconductors » 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

[17p-P7-1~21] 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P7 (P)

1:30 PM - 3:30 PM

[17p-P7-10] Temperature Dependence on Package Sealing Ambient of MEMS Inertial Sensor Fabricated by Multi-layer Metal Technology

Toshifumi Konishi1,2, Daisuke Yamane2, Teruaki Safu1, Chun-Yi Chen2, Tso-Fu Mark Chang2, Hiroyuki Ito2, Shiro Dosho2, Noboru Ishihara2, Masato Sone2, Katsuyuki Machida2, Kazuya Masu2, Shinichi Iida1 (1.NTT-AT, 2.Tokyo Tech.)

Keywords:MEMS inertial sensor, temperature dependence, sealing ambient

We have developed a highly-sensitive MEMS inertial sensor fabricated by gold multi-layer metal technology. To apply our sensor to the applications such as human motion monitoring or postural control of consumer electronics, it is necessary to investigate the relationships between device behaviors and sealing ambient. This work reports temperature dependence on package sealing ambient for our fabricated sensors.