The 65h JSAP Spring Meeting, 2018

Presentation information

Poster presentation

13 Semiconductors » 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

[17p-P7-1~21] 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P7 (P)

1:30 PM - 3:30 PM

[17p-P7-9] Fabrication of Au–Cu Alloys for MEMS Applications by Electroplating Method and Its Micro-mechanical Property

〇(DC)Haochun Tang1, Chun-Yi Chen1, Tso-Fu Mark Chang1, Daisuke Yamane1, Toshifumi Konishi1,2, Katsuyuki Machida1, Kazuya Masu1, Masato Sone1 (1.IIR, Tokyo Tech, 2.NTT AT)

Keywords:gold copper alloy, electroplating, micro-compression test