The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

13 Semiconductors » 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

[20a-C101-1~11] 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

Tue. Mar 20, 2018 9:15 AM - 12:15 PM C101 (52-101)

Masato Sone(Titech)

10:30 AM - 10:45 AM

[20a-C101-6] First-principles study on Schottky barrier at TiN/Ge interfacesⅡ -Effects of disorder-

Toshiki Nishimoto1, Takashi Nakayama1 (1.Chiba Univ.)

Keywords:germanium, Ge, Schottky barrier, titanium nitride, TiN