The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

8 Plasma Electronics » 8.2 Plasma deposition of thin film, plasma etching and surface treatment

[18a-C309-1~10] 8.2 Plasma deposition of thin film, plasma etching and surface treatment

Wed. Sep 18, 2019 9:00 AM - 12:00 PM C309 (C309)

Keiichiro Urabe(Kyoto Univ.), Takayoshi Tsutsumi(名大)

11:45 AM - 12:00 PM

[18a-C309-10] Electronic properties and dissociation channels of CH3F

Toshio Hayashi1, Kenji Ishikawa1, Makoto Sekine1, Masaru Hori1 (1.Nagoya university)

Keywords:Semiconductor, Etching

Electronic properties and dissociation channels of CH3F were not fully discussed. On the other hand, electronic properties of CH3I were comprehensively discussed by Herzberg and suggested that an excited state shifts from the C3v to a Cs structure by strong Jahn-Teller effect. Similarly, it can be thought that the excitation of CH3F is also affected by strong Jahn-Teller effect. The VUV spectrum of CH3F was reported by Locht et al., in which C band (11.3 eV) is a matter of argument. This band cannot be represented at the ground state minimum structure (C3v) by using EOMCCSD/aug-cc-pVTZ+4s+4p.
We calculated the potential surfaces for excited states along F-C-H angle, C-F bond length, and C-H bond length to clarify the strong Jahn-Teller effect and dissociation channels. We confirmed the Jahn-Teller effect and the dissociation channels of CH3F to CH3+ + F- along the C-F bond length and to CH2 + HF along F-C-H bong angle.