Symposium (Oral)

[10p-Z15-1~10] Recent progress in Advanced Ion Microscopy: Application to nano materials / devices and life science

Thu. Sep 10, 2020 1:30 PM - 5:45 PM Z15

Reo Kometani(Univ. of Tokyo), Shinichi Ogawa(AIST)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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1:30 PM - 2:00 PM

▲ [10p-Z15-1] Nanostructuring for heat flux management in semiconductor thin films

〇Masahiro Nomura¹ (1.Univ. of Tokyo)

2:00 PM - 2:15 PM

▲ [10p-Z15-2] Graphene nanomesh patterned by helium ion beam milling towards the application of quantum devices

〇(P)Fayong Liu¹, Manoharan Muruganathan¹, Shinichi Ogawa², Yukinori Morita², Zhongwang Wang¹, Marek Schmidt¹, Hiroshi Mizuta¹ (1.JAIST, 2.AIST)

2:15 PM - 2:45 PM

▲ [10p-Z15-3] Fabrication of nanofiber Bragg cavities using a Neon ion beam

〇Hideaki Takashima¹, Hiroki Kawaguchi¹, Konosuke Shimazaki¹, Toshiyuki Tashima¹, Shigeki Takeuchi¹ (1.Kyoto Univ.)

2:45 PM - 3:00 PM

▲ [10p-Z15-4] Helium Ion Beam Induced Stress on Graphene Cantilever

〇(PC)Ahmed HAMMAM^1,2, Shinichi Ogawa³, Yukinori Morita³, Amit Banerjee², Manoharan Muruganathan², Hiroshi Mizuta² (1.Minia Univ, 2.JAIST, 3.AIST)

3:00 PM - 3:30 PM

▲ [10p-Z15-5] Application of Neon Ion Beam for Processing III-V Semiconductors and Atom Probe Sample Preparation of Ga Sensitive Materials

Deying Xia², 〇Hanfang Hao¹, Vignesh Viswanathan¹, John Notte² (1.Carl Zeiss Pte Ltd, 2.Carl Zeiss SMT Inc.)

3:45 PM - 4:15 PM

▲ [10p-Z15-6] Analytical capabilities on FIB instruments using SIMS: applications, current developments and prospects

〇Olivier De Castro¹, Jean-Nicolas Audinot¹, Antje Biesemeier¹, Quang Hung Hoang¹, Tom Wirtz¹ (1.LIST)

4:15 PM - 4:45 PM

▲ [10p-Z15-7] Large scale integrated superconducting Josephson circuits fabricated with focused helium ion irradiation

〇Shane Cybart¹ (1.Univ. of California, Riverside)

4:45 PM - 5:00 PM

▲ [10p-Z15-8] Negative magnetoresistance of helium-ion-irradiated graphene in the strong Anderson localization regime

Tatsuya Iwasaki¹, Manoharan Muruganathan², Masashi Akabori², Yoshifumi Morita³, Satoshi Moriyama¹, 〇Shinichi Ogawa⁴, Yutaka Wakayama¹, Hiroshi Mizuta^2,5, Shu Nakaharai¹ (1.NIMS, 2.JAIST, 3.Gunma Univ., 4.AIST, 5.Hitachi)

5:00 PM - 5:30 PM

▲ [10p-Z15-9] Ion beam based analysis for medical application

〇Mitsutoshi Setou^1,2 (1.Hamamatsu Univ. Sch. of Medicine, 2.International Mass Imaging Center)

5:30 PM - 5:45 PM

▲ [10p-Z15-10] Evaluation method of vibration spectra of nanomechanical resonators using Helium Ion Microscope

〇Masaki Saito¹, Shinichi Ogawa^2,3, Yukinori Morita^2,3, Shin'ichi Warisawa^1,3, Reo Kometani^1,3 (1.Univ. of Tokyo, 2.AIST, 3.Operando-OIL)

Sessions

Symposium » Recent progress in Advanced Ion Microscopy: Application to nano materials / devices and life science