4:15 PM - 4:30 PM
△ [17p-Z26-9] Direct imaging of crystallographic tilting in isotopically controlled 28Si/SiGe substrate
Keywords:Si qubit, SiGe, Transmission Electron Microscope (TEM)
Oral presentation
13 Semiconductors » 13.5 Semiconductor devices/ Interconnect/ Integration technologies
Wed. Mar 17, 2021 1:30 PM - 6:00 PM Z26 (Z26)
Kazuhiko Endo(AIST), Kimihiko Kato(AIST)
4:15 PM - 4:30 PM
Keywords:Si qubit, SiGe, Transmission Electron Microscope (TEM)