[C-2-2] Characterization of Semi-Insulating GaAs Substrates for GaAs ICs

S. Miyazawa, Y. Nanishi (1.Musashino Electrical Communication Laboratory, N.T.T.)

1982 International Conference on Solid State Devices |PDF Download

[C-2-3] Characterization of Computer Controlled GaP Single Crystals

M. Watanabe, J. Ushizawa, S. Washizuka, Y. Kokubun (1.Toshiba Research and Development Center, Toshiba Corporation)

1982 International Conference on Solid State Devices |PDF Download

[C-2-4] Modified Schottky Barrier Heights by Interfacial Doped Layers: MBE Al on GaAs

Stephen J. Eglash, Shihong Pan, Dang Mo, William E. Spicer, Douglas M. Collins (1.Stanford Electronics Laboratories, Stanford University, 2.Solid State Laboratory, Hewlett-Packard Laboratories)

1982 International Conference on Solid State Devices |PDF Download

[C-2-5] Recent Advances in Josephson Device and Material

Hisao Hayakawa (1.Electrotechnical Laboratory)

1982 International Conference on Solid State Devices |PDF Download

[C-2-6] Hysteresis Loop in Current-Voltage Curve for BaPb0.7Bi0.3O3 Josephson Junction Array in a Microwave Field

M. Ito, Y. Enomoto, T. Murakami (1.Ibaraki Electrical Communication Laboratory, NTT)

1982 International Conference on Solid State Devices |PDF Download

[C-2-7] Josephson Full Adder Circuit Using Four-Junction Logic(4JL) Gate

Hiroshi Nakagawa, Eiichi Sogawa, Susumu Takada, Hisao Hayakawa (1.Electrotechnical Laboratory)

1982 International Conference on Solid State Devices |PDF Download

[A-3-1] High Voltage Dielectric Isolated IC Technology

Y. Sugawara, T. Kamei, Y. Hosokawa, S. Okuhara, I. Oohinata (1.Hitachi Research Laboratory and Totsuka Works, Hitachi, Ltd.)

1982 International Conference on Solid State Devices |PDF Download

[A-3-2] Novel Gate-Protection Devices for MOSFET's

Isao YOSHIDA, Takeaki OKABE, Kazutoshi ASHIKAWA, Shigeo OOTAKA (1.Central Research Laboratory, 2.Takasaki Works, Hitachi Ltd.)

1982 International Conference on Solid State Devices |PDF Download

[A-3-3] Compatible High and Low Voltage CMOS Devices using SIMOX Technology

Masahiro AKIYA, Sadao NAKASHIMA, Kotaro KATO (1.Musashino Electrical Communication Laboratory, N.T.T.)

1982 International Conference on Solid State Devices |PDF Download

[A-3-4] MNOS Retention-Endurance Characteristics Enhancement Using Graded Nitride Dielectric

Yukun Hsia, Eden Mei, Kia L. Ngai (1.McDonnell Douglas Astronautics Company, 2.Naval Research Laboratory)

1982 International Conference on Solid State Devices |PDF Download