Oral presentation
15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects
Thu. Sep 15, 2016 9:00 AM - 11:45 AM A23 (201B)
Kentaro Kutsukake(Tohoku Univ.), Hiroki Kawai(Toshiba)
△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above
9:00 AM - 9:15 AM
〇Satoshi Nakano1, Bing Gao1, Koichi Kakimoto1 (1.RIAM, Kyushu Univ.)
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9:15 AM - 9:30 AM
〇Xin Liu1, Satoshi Nakano1, Koichi Kakimoto1 (1.RIAM, Kyushu Univ.)
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9:30 AM - 9:45 AM
〇Takao Abe1, Takahashi Toru1, Shirai Koun2 (1.ShinEtsu Handotai, 2.ISIR, Osaka Univ.)
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9:45 AM - 10:00 AM
〇Takao Abe1, Takahashi Toru1, Shirai Koun2 (1.ShinEtsu Handotai, 2.ISIR, Osaka Univ.)
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10:00 AM - 10:15 AM
〇Junji Matsui1, Yoshiyuki Tsusaka2, Tetsuya Tsurumaru2, Takao Abe3 (1.SR Nano-Tech.Center, Univ. Hyogo, 2.Grad. School mat. Sci., Univ. Hyogo, 3.ShinEtsu Handotai)
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10:30 AM - 10:45 AM
〇Tatsuhiko Aoki1, Haruo Sudo1, Koji Araki1, Koji Izunome1 (1.GlobalWafers Japan)
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10:45 AM - 11:00 AM
〇Haruo Sudo1, Koji Araki1, Tatsuhiko Aoki1, Takeshi Senda1, Susumu Maeda1 (1.GlobalWafers Japan)
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11:00 AM - 11:15 AM
〇Hideyuki Okamura1, Haruo Sudo1, Koji Araki1, Hiroyuki Saito1, Susumu Maeda1, Koji Sueoka2, Kozo Nakamura3 (1.GlobalWafers Japan, 2.Faculty of Computer Science and System Engineering, Okayama Pref. Univ., 3.Regional Cooperative Research Organization, Okayama Pref. Univ.)
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11:15 AM - 11:30 AM
〇Susumu Maeda1, Haruo Sudo1, Koji Araki1, Hiroyuki Saito1 (1.GlobalWafers Japan)
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11:30 AM - 11:45 AM
〇Eiji Kamiyama1,2, Koji Sueoka1 (1.Okayama Pref. Univ., 2.GlobalWafers Japan Co., Ltd.)
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