[A06-3am] 06. Analytical Chemistry

[A06-3am-01] X-ray elemental analysis of Ge quantum dots on a Si substrate using an X-ray induced force change through X-ray aided atomic force microscopy (XANAM)

^○Shushi Suzuki¹, Shingo Mukai², Wang Jae Chun³, Masaharu Nomura⁴, Syuntarou Fujimori¹, Mitsuhisa Ikeda¹, Katsunori Makihara¹, Seiichi Miyazaki¹, Kiyotaka Asakura² (1. Nagoya University, 2. Hokkaido University, 3. International Christian University, 4. KEK)

[Lang.] Japanese

Keywords:X-ray Elemental Analysis, Noncontact Atomic Force Microscopy, Synchrotron Radiation X-ray, Germanium, Quantum Dot