Tu-1: GaN-1

[Tu1-4] Linear relationship between dislocation pattern size induced by Vickers indentation and imprint width on (0001) GaN

*Yukari Ishikawa¹, Yoshihiro Sugawara¹, Yongzhao Yao¹, Syusui Ogawa¹, Daisaku yokoe¹, Hidetoshi Takeda², Hieo Aida², Kazuyuki Tadatomo³ (1. Japan Fine Ceramics Center, 2. Nagaoka University of Technology, 3. Yamaguchi University)