The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

8 Plasma Electronics » 8.2 Plasma deposition of thin film, plasma etching and surface treatment

[18p-C309-1~13] 8.2 Plasma deposition of thin film, plasma etching and surface treatment

Wed. Sep 18, 2019 1:45 PM - 5:15 PM C309 (C309)

Akihisa Ogino(Shizuoka Univ.), Shota Nunomura(AIST)

3:45 PM - 4:00 PM

[18p-C309-8] Negative plasma potential in Mg-CF4 direct current reactive sputtering discharge

Eiji Kusano1 (1.Kanazawa Inst.Technol.)

Keywords:Reactive sputtering, Negative ions, Electronegative plasma

Plasma potential in Mg-CF4 direct current reactive sputtering discharge has been evaluated by probe measurements as a function of CF4 concentration in Ar-CF4 discharge gas. With increasing CF4 concentration, the plasma potential shifted to negative and reached approximately – 50 V for 100%-CF4 discharge at a discharge pressure of 1.2 Pa. Simultaneously, under this condition, the floating potential reached -80 V. In the second derivative of the probe current-voltage curves, the shoulder peaks corresponding to the current by energetic negative ions have been investigate. It is further observed that the shoulder peak intensity in the second derivative curves well correlates to the plasma potential shift. It is concluded that the negative shift of plasma potential in Mg-CF4 direct current reactive discharge results from the negative ion formation.