The Japan Society of Applied Physics

[PS-10-01] Reliability of 60-nm scale CAAC-IGZO FET

H. Kimura1, D. Shimada1, N. Kamata1, M. Motoyoshi1, Y. Asami1, K. Sugaya1, R. Hodo1, T. Murakawa1, M. Takahashi1, S. Yamazaki1 (1.Semiconductor Energy Laboratory Co., Ltd. (Japan))

2018 International Conference on Solid State Devices and Materials |Wed. Sep 12, 2018 4:30 PM - 4:31 PM |PDF Download

[PS-10-05] Withdrawn

2018 International Conference on Solid State Devices and Materials |Wed. Sep 12, 2018 4:34 PM - 4:35 PM

[PS-10-09] Conduction and valence band offsets of ZnO/β-Ga2O3 interface measured by X-ray photoelectron spectroscopy

S.M. Sun1, W.J. Liu1, Y.P. Wang1, Y.W. Huan1, H. Liu1, Y. Shao1, B. Zhu1, R.H. Horng2, C.T. Xia3, S.J. Ding1, D.W. Zhang1 (1.Fudan Univ. (China), 2.National Chiao Tung Univ. (Taiwan), 3.Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China))

2018 International Conference on Solid State Devices and Materials |Wed. Sep 12, 2018 4:38 PM - 4:39 PM |PDF Download

[PS-10-10] Withdrawn

2018 International Conference on Solid State Devices and Materials |Wed. Sep 12, 2018 4:39 PM - 4:40 PM