[C-7-4] The Characterization of Defect States Responsible for Leakage Current in Tantalum Pentoxide Films for Very High Density DRAM Applications
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
340件中(261 - 270)
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード
1994 International Conference on Solid State Devices and Materials |PDF ダウンロード