[C-8-4] Direct evidence of localized states in high-k materials for gate insulator - Cathode luminescence study of HfO2 films -
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
428件中(381 - 390)
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード
2002 International Conference on Solid State Devices and Materials |PDF ダウンロード