[B-3-4L] Mobility Increase in High-Ns Region in (110)-Oriented UTB pMOSFET Through Surface Roughness Improvement
2005 International Conference on Solid State Devices and Materials |PDF Download
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2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download