Oral presentation

[5p-S41-1~20] 7.2 Applications and technologies of electron beams

Tue. Sep 5, 2017 1:15 PM - 6:45 PM S41 (Conf. Room 1)

Tadahiro Kawasaki(JFCC), Nobuhiro Ishikawa(NIMS), Shigekazu Nagai(Mie Univ.)

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▲：英語発表
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1:15 PM - 1:45 PM

[5p-S41-1] [INVITED] Direct Measurement of Wavefront of Electron Vortex Beams

〇Ken Harada¹ (1.RIKEN)

1:45 PM - 2:00 PM

[5p-S41-2] In-situ TEM observation of the reaction of Fe₂O₃ and Si or Si base ceramics

〇Nobuhiro Ishikawa¹, Tadashi Mitsui¹, Masaki Takeguchi¹, Kazutaka Mitsuishi¹ (1.NIMS)

2:00 PM - 2:15 PM

[5p-S41-3] Li analysis of the Ar sputtered Li compounds using REELS with HSA

〇Noboru Taguchi¹, Akihiro Tanaka², Konomi Yoshida², Kenichi Tsutsumi², Yasushi Maeda¹, Shingo Tanaka¹ (1.AIST RIECEN, 2.JEOL)

2:15 PM - 2:30 PM

[5p-S41-4] Noise reduction of electron holograms using wavelet hidden Markov model (II)

〇Yoshihiro Midoh¹, Katsuyoshi Miura¹, Yasukazu Murakami², Koji Nakamae¹ (1.Osaka Univ., 2.Kyushu Univ.)

2:30 PM - 2:45 PM

[5p-S41-5] Simulation study on S/TEM images observed in liquids

〇Tadahiro Kawasaki¹, Kaname Yoshida¹, Yukichi Sasaki¹, Shinya Nagashima², Keisuke Kishita² (1.JFCC, 2.TOYOTA)

2:45 PM - 3:00 PM

△ [5p-S41-6] TEM Observation of Proteins in Solution at Room Temperature with Graphene Sandwiched Structure

〇Yuki Sasaki^1,2, Tadahiro Kawasaki¹, Masanori Koshino², Chikara Sato², Kazutomo Suenaga² (1.JFCC, 2.AIST)

3:00 PM - 3:15 PM

▼ [5p-S41-7] Dependence of channeling contrast on detection angle in SEMs

〇Thantip Sirinabhigupta Krasienapibal¹, Yasuhiro Shirasaki¹, Momoyo Enyama¹ (1.HItachi Ltd.)

3:15 PM - 3:30 PM

△ [5p-S41-8] Measurement of the flare electron current distribution in scanning electron microscope

〇Yoshifumi Hagiwara¹, Kentaro Morimoto¹, Yuka Ito¹, Masatoshi Kotera¹ (1.Osaka Tech.)

3:30 PM - 3:45 PM

△ [5p-S41-9] Three-dimensional trajectory simulation of scattered electrons in scanning electron microscope specimen chamber

〇Kazumasa Terada¹, Yoshifumi Hagawara¹, Masatoshi Kotera¹ (1.Osaka Inst.)

3:45 PM - 4:00 PM

[5p-S41-10] On flare electrons causing positively electrification from the vicinity of electron beam irradiation to distant place

〇Shota Nishimura¹, Takuya Kawamoto¹, Masatoshi Kotera¹ (1.Osakakougyou Univ.)

4:15 PM - 4:30 PM

△ [5p-S41-11] Development of Field Emitter Array on a Transparent Substrate for Optical Control

〇Toya Kera¹, Kentaro Iwami¹, Norihiro Umeda¹ (1.Tokyo Univ. of Agriculture and Technology)

4:30 PM - 4:45 PM

[5p-S41-12] Uniformity of magnification in electrostatic divergent lens with short focal length

〇(M1)Saba Maeda¹, Hiroshi Tsuji¹, Yasuhito Gotoh¹ (1.Kyoto Univ.)

4:45 PM - 5:00 PM

[5p-S41-13] Investigation of Suitable Approximation Order of 2-variable Function of Exposure Conditions for Half-pitch 50 nm Line-and-space Pattern Formed by Electron-beam Lithography

〇Masahito Kurouchi¹, Manabu Yasui¹, Satoru Kaneko¹ (1.KISTEC)

5:00 PM - 5:15 PM

[5p-S41-14] High intensity X-ray excited by electron beam field-emitted from liquid Li electron source and imaging of X-ray radiography

〇Shinichiro Ohta¹, Shigekazu Nagai¹, Tatsuo Iwata¹, Koichi Hata¹ (1.Mie Univ.)

5:15 PM - 5:30 PM

[5p-S41-15] Self-sensing cantilever using electron-beam-deposited Pt

〇Kenta Kashida¹, Fujio Wakaya¹, Hayato Yamashita^1,2, Yuji Miyato¹, Satoshi Abo¹, Masayuki Abe¹ (1.Osaka Univ., 2.JST PRESTO)

5:30 PM - 5:45 PM

[5p-S41-16] Electrical States of Conductive Ceramic Material for Transfer Mold Field Emitter Arrays by First-Principles Calculation (Ⅵ)

MASATO ITO¹, MASAYUKI NAKAMOTO¹, 〇JONGHYUN MOON¹ (1.Shizuoka Univ.)

5:45 PM - 6:00 PM

[5p-S41-17] Development of low work function LaB₆ cathode with infiltration of carbide solution

Takaya Kobayashi¹, Tomoya Yokoyama¹, 〇Hidekazu Murata¹, Eiji Rokuta¹, Hiroshi Shimoyama¹, Hiroshi Yasuda², Yoshihisa Ooae² (1.Meijo Univ., 2.PARAM Corp.)

6:00 PM - 6:15 PM

[5p-S41-18] Influence of oxygen on metal boride thermionic cathode

〇Takaya Kobayashi¹, Tomoya Yokoyama¹, Hidekazu Murata¹, Eiji Rokuta¹, Hiroshi Shimoyama¹, Hiroshi Yasuda² (1.Meijo Univ., 2.PARAM Corp.)

6:15 PM - 6:30 PM

[5p-S41-19] Measurement of emission current from individual working emitter in volcano-structured Spindt-type field emitter arrays using evaluation instrument for multi-emitters

〇Kodai Taguchi¹, HIdekazu Murata¹, Eiji Rokuta¹, Hiroshi Shimoyama¹, Masayoshi Nagao², Katsuhisa Murakami² (1.Meijo Univ., 2.AIST)

6:30 PM - 6:45 PM

[5p-S41-20] Continuous Operation of Field Emitter Arrays under High Dose Rate X-ray Irradiation

〇Teruyuki Morito¹, Hiroshi Tsuji¹, Masayoshi Nagao², Masafumi Akiyoshi³, Ikuji Takagi¹, Yasuhito Gotoh¹ (1.Kyoto Univ, 2.AIST, 3.Osaka Pref. Univ)

Poster presentation

[6a-PA6-1~3] 7.2 Applications and technologies of electron beams

Wed. Sep 6, 2017 9:30 AM - 11:30 AM PA6 (P)

△：奨励賞エントリー
▲：英語発表
▼：奨励賞エントリーかつ英語発表
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9:30 AM - 11:30 AM

[6a-PA6-1] Development of gas environmental heating TEM specimen holder

〇Hajime Akimoto^1,2, Masaki Takeguchi^2,1, Takashi Sekiguchi^2,1, Ayako Hashimoto^2,1 (1.Tsukuba Univ., 2.NIMS)

9:30 AM - 11:30 AM

[6a-PA6-2] Development of Electrochemical Cell for Scanning Electron Microscopy

〇Gada He¹, Masahiko Tomitori¹, Yoshifumi Oshima¹ (1.JAIST)

9:30 AM - 11:30 AM

[6a-PA6-3] Electron scattering simulation to design Faraday cup

〇Takatoshi Donga¹, Yuka Ito¹, Masatoshi Kotera¹ (1.Osaka Institute of Technology)

Sessions

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[5p-S41-1~20] 7.2 Applications and technologies of electron beams

[5p-S41-1] [INVITED] Direct Measurement of Wavefront of Electron Vortex Beams

[5p-S41-2] In-situ TEM observation of the reaction of Fe₂O₃ and Si or Si base ceramics

[5p-S41-3] Li analysis of the Ar sputtered Li compounds using REELS with HSA

[5p-S41-4] Noise reduction of electron holograms using wavelet hidden Markov model (II)

[5p-S41-5] Simulation study on S/TEM images observed in liquids

△ [5p-S41-6] TEM Observation of Proteins in Solution at Room Temperature with Graphene Sandwiched Structure

▼ [5p-S41-7] Dependence of channeling contrast on detection angle in SEMs

△ [5p-S41-8] Measurement of the flare electron current distribution in scanning electron microscope

△ [5p-S41-9] Three-dimensional trajectory simulation of scattered electrons in scanning electron microscope specimen chamber

[5p-S41-10] On flare electrons causing positively electrification from the vicinity of electron beam irradiation to distant place

△ [5p-S41-11] Development of Field Emitter Array on a Transparent Substrate for Optical Control

[5p-S41-12] Uniformity of magnification in electrostatic divergent lens with short focal length

[5p-S41-13] Investigation of Suitable Approximation Order of 2-variable Function of Exposure Conditions for Half-pitch 50 nm Line-and-space Pattern Formed by Electron-beam Lithography

[5p-S41-14] High intensity X-ray excited by electron beam field-emitted from liquid Li electron source and imaging of X-ray radiography

[5p-S41-15] Self-sensing cantilever using electron-beam-deposited Pt

[5p-S41-16] Electrical States of Conductive Ceramic Material for Transfer Mold Field Emitter Arrays by First-Principles Calculation (Ⅵ)

[5p-S41-17] Development of low work function LaB₆ cathode with infiltration of carbide solution

[5p-S41-18] Influence of oxygen on metal boride thermionic cathode

[5p-S41-19] Measurement of emission current from individual working emitter in volcano-structured Spindt-type field emitter arrays using evaluation instrument for multi-emitters

[5p-S41-20] Continuous Operation of Field Emitter Arrays under High Dose Rate X-ray Irradiation

[6a-PA6-1~3] 7.2 Applications and technologies of electron beams

[6a-PA6-1] Development of gas environmental heating TEM specimen holder

[6a-PA6-2] Development of Electrochemical Cell for Scanning Electron Microscopy

[6a-PA6-3] Electron scattering simulation to design Faraday cup

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