The Japan Society of Applied Physics

[B-7-3] Set Voltage Statistics in Unipolar HfO2-Based RRAM

S. Long1,2、C. Cagli3、J. Buchley3、Q. Liu1、H. Lv1、X. Lian2、E. Miranda2、D. Jimenez2、M. Liu1、J. Sune2 (1.Inst. of Microelectronics, Chinese Academy of Sciences , China、2.Universitat Autonoma de Barcelona , Spain、3.CEA, LETI , France)

2012 International Conference on Solid State Devices and Materials |PDF ダウンロード