The Japan Society of Applied Physics

415 results (191 - 200)

[F-2-06] Inelastic X-ray Scattering Measurement on SiGeSn Polycrystalline Alloy

〇Yosuke Shimura1,2, Kako Iwamoto1, Ryo Yokogawa3,4, Motohiro Tomita5, Hirokazu Tatsuoka1, Hiroshi Uchiyama6, Atsushi Ogura3,4 (1. Shizuoka Univ.(Japan), 2. Res. Inst. Electron.(Japan), 3. Meiji Univ.(Japan), 4. MREL(Japan), 5. Waseda Univ.(Japan), 6. JASRI(Japan))

2020 International Conference on Solid State Devices and Materials |Mon. Sep 28, 2020 5:15 PM - 5:30 PM |PDF Download

415 results (191 - 200)