The Japan Society of Applied Physics

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[C-10-05] Impact of Grain Boundaries in MgO Layer on Data Retention Performance of STT-MRAM

〇Keisuke Morishita1, Yosuke Harashima2, Masaaki Araidai1,3, Tetsuo Endoh4,5,6, Kenji Shiraishi1,3,4 (1. Univ. of Nagoya (Japan), 2. NAIST (Japan), 3. Inst. of Materials and Systems for Sustainablity (Japan), 4. Center for Innovative Intergrated Electronic Systems (Japan), 5. Univ. of Tohoku (Japan), 6. Research Inst. Electrical Communiaction (Japan))

2022 International Conference on Solid State Devices and Materials |2022年9月29日(木) 17:00 〜 17:15 |PDF ダウンロード

419件中(111 - 120)