The Japan Society of Applied Physics

419 results (381 - 390)

[K-6-06] 18nm pitch EUVL Line/Space double-patterning exploration for N3 BEOL

〇Stephane LARIVIERE1, Stefan DECOSTER1, Sara PAOLILLO1, Vincent RENAUD1, Diana TSVETANOVA1, Bart KENENS1, Hanne DE COSTER1, Quoc Toan LE1, Yusuke ONIKI1, Alfonso SEPULVEDA MARQUEZ1, Karen STIERS1, Felix SEIDEL1, Martin O'TOOLE1, Mircea DUSA1, Kurt RONSE1, Chris WILSON1 (1. imec (Belgium))

2022 International Conference on Solid State Devices and Materials |Wed. Sep 28, 2022 3:00 PM - 3:15 PM |PDF Download

419 results (381 - 390)