[S-I-3-1] Single Atom Manipulation and Its Real-Time Detection by STM

Masakazu AONO (1.Surface and Interface Laboratory, Institute of Physical and Chemical Research (RIKEN), 2.Aono Atomcraft Project, Research Development Corporation of Japan (JRDC))

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-3-2] Direct Observation of a Scanning Tunneling Microscope Tip Apex Using a Transmission Electron Microscope

M. I. Lutwyche, Y. Wada (1.Advanced Research Laboratory, Hitachi, Ltd.)

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-3-3] Observation of Positively Charged Trap Site in Silicon Oxide Layer with an Atomic Force Microscope

Yoshinobu FUKANO, Takahiro OKUSAKO, Takayuki UCHIHASHI, Yasuhiro SUGAWARA, Yoshiki YAMANISHI, Takahiko OASA, Seizo MORITA (1.Department of Physics, Faculty of Science, Hiroshima University, 2.Advanced Technology Research Lab., Sumitomo Metal Industries, Ltd.)

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-3-4] Evaluation of Thin SiO2 Layers by Beam Assisted Scanning Tunneling Microscope

Seiji Heike, Yasuo Wada, Seiichi Kondo, Mark Lutwyche, Ken Murayama, Hiroshi Kuroda (1.Advanced Research Laboratory, Hitachi, Ltd., 2.Technical Research Laboratory, Research and Development Division, Hitachi Construction Machinery Co., Ltd.)

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-4-1] AFM-Based Fabrication of Semiconductor Nanostructures

E. S. Snow, P. M. Campbell, P. J. McMarr (1.Naval Research Laboratory)

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-4-2] First Application of STM Nano-Meter Size Oxidation Process to Planar-Type MIM Diode

KAZUHIKO MATSUMOTO, Shu Takahashi, Masami Ishii, Masakatsu Hoshi, Akira Kurokawa, Shingo Ichimura, Atsushi Ando (1.Electrotechnical Laboratory MITI, 2.Nissan Motor Co., LTD.)

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-4-3] AFM Observation of Self-Assembled Monolayer Films on GaAs(110)

Hirotaka OHNO, Makoto MOTOMATSU, Wataru MIZUTANI, Hiroshi TOKUMOTO (1.Joint Research Center for Atom Technology (JRCAT), Angstrom Technology Partnership (ATP), 2.Joint Research Center for Atom Technology (JRCAT), National Institute for Advanced Interdisciplinary Research (NAIR))

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-4-4] 2×6 Surface Reconstruction of Sulfur-Terminated GaAs (001) Observed by Scanning Tunneling Microscopy

Shiro Tsukamoto, Nobuyuki Koguchi (1.National Research Institute for Metals)

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-5-1] Spectroscopy of Quantum Dots and Antidots

Detlef Heitmann (1.Universitat Hamburg, Institut fur Angewandte Physik)

1994 International Conference on Solid State Devices and Materials |PDF Download

[S-I-5-2] Doped Nanocrystals of Semiconductors--A New Class of Luminescent Materials

R. N. Bhargava (1.Nanocrystals Technology)

1994 International Conference on Solid State Devices and Materials |PDF Download

340 results (11 - 20)

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