The Japan Society of Applied Physics

287 results (101 - 110)

[D-3-1] UHV-STM Nanofabrication and Semiconductor Interface Characterization: Transitions to CMOS Technology

J. W. Lyding, K. Hess, G. C. Abeln, E. T. Foley, J. Lee, Z. Chen, I. C. Kizilyalli, Ph. Avouris (1.Department of Electrical and Computer Engineering and Beckman Institute for Advanced Science and Technology, University of Illinois, 2.Lucent Technologies, Bell Laboratories, 3.IBM Research Division, T. J. Watson Research Center)

1997 International Conference on Solid State Devices and Materials |PDF Download

287 results (101 - 110)