The Japan Society of Applied Physics

633 results (171 - 180)

[G-4-02] Dielectric Breakdown of Low Temperature Deposited SiCN Layers

Lin Hou1, Venkat Sunil Kumar Channam2, Alicja Lesniewska2, Serena Lacovo2, Shuo Kang2, Joeri De Vos2, Anne Jourdain2, Gerald Beyer2, Kristof Croes2, Edward Walsby3, Kath Crook3, Igor Belov3, Yangyin Chen1, Yan Li1, Eric Beyne2 (1. Western Digital (United States of America), 2. IMEC (Belgium), 3. SPTS (United States of America))

2023 International Conference on Solid State Devices and Materials |Thu. Sep 7, 2023 11:00 AM - 11:15 AM |PDF Download

[G-5-03] Damascene Compatible Low Thermal Budget Fine-Pitch Copper Hybrid Boding with Ultra-Thin Surface Passivation

Hemanth Kuamr Cheemalamarri1, Gim Guan Chen1, Hongyu Li1, Chandra Rao Bhesetti1, Nagendra Sekhar Vasarla1, Nandini Venkataraman1, King Jien Chui1, Srinivasa Rao Vempati1, Navab Singh1 (1. Institute of Microelectronics, Agency for Science, Technology and Research (A*STAR), Singapore (Singapore))

2023 International Conference on Solid State Devices and Materials |Fri. Sep 8, 2023 9:45 AM - 10:00 AM |PDF Download

[G-5-04] Middle-End of Line Si FinFETs Using Laser-Liquid-Phase-Epitaxy Technique for Monolithic 3DIC

Bo- Jheng Shih1,2, Yu-Ming Pan1, Hao-Tung Chung1, Nei-Chih Lin2, Chih-Chao Yang2, Po-Tsang Huang1, Huang-Chung Cheng1, Chang-Hong Shen2, Jia-Min Shieh2, Wen-Fa Wu2, Kuan-Neng Chen1, Chenming Hu1,3 (1. Univ. of Yang Ming Chiao Tung (Taiwan), 2. Inst. of Taiwan Semiconductor Research (Taiwan), 3. Univ. of California, Berkeley (United States of America))

2023 International Conference on Solid State Devices and Materials |Fri. Sep 8, 2023 10:00 AM - 10:15 AM |PDF Download

633 results (171 - 180)