The 63rd JSAP Spring Meeting, 2016

Sessions

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

Oral presentation

[20a-H113-1~12] 15.8 Crystal evaluation, impurities and crystal defects

Sun. Mar 20, 2016 9:30 AM - 12:45 PM H113 (H)

Kentaro Kutsukake(Tohoku Univ.), Yuta Nagai(GlobalWafers Japan)

△:Young Scientist Oral Presentation Award Applied
▲:English Presentation
▼:Both Award Applied and English Presentation

11:30 AM - 11:45 AM

Kaori Watanabe1, Naohisa Inoue2,9, Yasunori Goto3, Takahide Sugiyama4, Hirofumi Seki5, Masumi Obuchi6, Hiroyuki Uno7, Noriyuki Fujiyama5, Shigeru Shimada8, Yuichi Kawamura9 (1.Systems Engineering, 2.Tokyuo U. Agri&Tech., 3.Toyota Motor Co., 4.Toyota C. L., 5.Toray Res., 6.Nanoscience, 7.S.H.I Exam., 8.Bruker, 9.Osaka P. U.)

11:45 AM - 12:00 PM

Naohisa Inoue1,6, Yasunori Gotou2, Takahide Sugiyama3, Hirofumi Seki4, Kaori Watanabe5, Yuichi Kawamura6 (1.Tokyuo U. Agri&Tech., 2.Toyota Motor Co., 3.Toyota Central Res. Labs., 4.Toray Research Inc., 5.Systems Engineering Inc., 6.Osaka Pref. U.)

Oral presentation

[20p-H113-1~13] 15.8 Crystal evaluation, impurities and crystal defects

Sun. Mar 20, 2016 2:15 PM - 5:45 PM H113 (H)

Koji Sueoka(Okayama Pref. Univ.), Yoshifumi Yamashita(Okayama Univ.)

△:Young Scientist Oral Presentation Award Applied
▲:English Presentation
▼:Both Award Applied and English Presentation

Poster presentation

[21p-P11-1~11] 15.8 Crystal evaluation, impurities and crystal defects

Mon. Mar 21, 2016 1:30 PM - 3:30 PM P11 (Gymnasium)

△:Young Scientist Oral Presentation Award Applied
▲:English Presentation
▼:Both Award Applied and English Presentation

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