The Japan Society of Applied Physics

566件中(191 - 200)

[E-8-6] Comparative Study of DC and Microwave Characteristics of 0.12 μm T-Shaped Gate AlGaAs/InGaAs/GaAs PHEMTs Using a Hybrid and Conventional E-beam Lithography Process

Jong-Won Lim、Seok-Won Yoon、Ho-Kyun Ahn、Hong-Gu Ji、Woo-Jin Chang、Jae-Kyoung Mun、Haecheon Kim (1.IT Components & Materials Technology Research Division, IT Convergence & Components Laboratory, Electronics and Telecommunications Research Institute)

2006 International Conference on Solid State Devices and Materials |PDF ダウンロード

566件中(191 - 200)