[P4-9] Effects of Voltage Cycling on Polarization and Reliability of 3D SBT Ferroelectric Capacitors Integrated in 0.18μm CMOS Technology.
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
533件中(431 - 440)
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード
2005 International Conference on Solid State Devices and Materials |PDF ダウンロード