[P-1-3] Reaction-Diffusion Devices Using Minority-Carrier Transport in Semiconductors

Yuusaku Nishimiya, Tetsuya Asai, Yoshihito Amemiya (1.Department of Electrical Engineering, Hokkaido University)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-4] All Digital Wireless Modem LSI for Software Defined Radio

Hiroyuki Nakase, Shinji Ueda, Kazuo Tsubouchi (1.Research Institute of Electrical Communication, Tohoku University)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-5] Error Analysis on Simultaneous Data Transfers in CDMA Wired Interface

Hiroshi Iwamura, Ryuji Yoshimura, Tan Boon Keat, Toshimasa Matsuoka, Kenji Taniguchi (1.Department of Electronics and Information Systems, Faculty of Engineering, Osaka University)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-6] Comprehensive Study on Reliability of Low-Temperature Poly-Si TFTs under Dynamic CMOS Operations

Yukiharu Uraoka, Hiroshi Yano, Tomoaki Hatayama, Takashi Fuyuki (1.Nara Institute of Science and Technology, Material Science)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-7] Investigation of Interconnect Temperature Rise due to Joule Heating and Its Effect on Electromigration Reliability

S. Miyazaki, H. Sakaue, S. Shingubara, T. Takahagi (1.Hiroshima University, Graduate School of ADSM)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-8] Low Temperature BST-CVD Process for the Concave-Type Capacitors Designed for Logic-Base-Embedded DRAMs

Akihiko Tsuzumitani, Yasutoshi Okuno, Hisashi Ogawa, Yoshihiro Mori, Charles N. Dornfest, Xiaoliang Jin, Shreyas Kher, Jerry Tao, Yaxin Wang, Jun Zhao (1.ULSI Process Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Co., Ltd., 2.Applied Materials)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-9] High-Performance Low-k Dielectric Using Advanced EB-Cure Process

Miyoko Shimada, Hideshi Miyajima, Rempei Nakata, Takashi Yoda (1.TOSHIBA CORPORATION SEMICONDUCTOR COMPANY)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-10] Effect of Plasma Nitridation on the Conduction Mechanism of Ta2O5 Gate Dielectric

Woo Hyung Lee, Kiju Im, Sanghun Joen, Hyunsang Hwang (1.Department of Materials Science and Engineering, Kwangju Institute of Science and Technology)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-11] Nucleation and Growth Control of Al-CVD for Dual-Damascene Application

T. Iino, M. Sugiyama, H. Itoh, J. Aoyama, H. Komiyama, Y. Shimogaki (1.Department of Materials Engineering, University of Tokyo, 2.Department of Chemical System Engineering, University of Tokyo, 3.Semiconductor Technology Academic Research Center)

2001 International Conference on Solid State Devices and Materials |PDF Download

[P-1-12] Novel Methods to Incorporate Deuterium in the MOS Structures and Isotope Effects on Soft Breakdown and Interface States

C.-H. Lin, M. H. Lee, B.-C. Hsu, C. W. Liu (1.Dept. of Electrical Engineering, National Taiwan University)

2001 International Conference on Solid State Devices and Materials |PDF Download

338 results (201 - 210)

« Prev
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
Next »

▲