[A-4-6] Theoretical Investigation of the Electronic Properties of PEDOT: PSS Conducting Polymer on Indium Tin Dioxide (ITO) Surface: an Accelerated Quantum Chemical Molecular Dynamics Method

Chen Lv, Xiaojing Wang, Agalya Govindasamy, Hideyuki Tsuboi, Michihisa Koyama, Momoji Kubo, Akira Miyamoto (1.Department of Applied Chemistry, Graduate School of Engineering, Tohoku University, 2.New Industry Creation Hatchery Center, Tohoku University, 3.PRESTO, Japan Science and Technology)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-5-1] Successful CMOS Operation of Dopant-Segregation Schottky Barrier Transistors (DS-SBTs)

A. Kinoshita, Y. Tsuchiya, A. Yagishita, K. Uchida, J. Koga (1.Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation, 2.Process and Manufacturing Engineering Center, Semiconductor Company, Toshiba Corporation)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-5-2] Optimization of Low Power and High Speed DTM for Embedded RAM Applications

H. Tashiro, K. Tsunoda, A. Sato, T. Nakanishi, H. Tanaka (1.Fujitsu Laboratories Ltd.)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-5-3] Realization of n-type and p-type Si-Microprobe Array Using In-Situ Doping with Selective Vapor-Liquid-Solid (VLS) Growth Method

Md. Shofiqul Islam, Hiroshi Ishino, Takeshi Kawano, Hidekuni Takao, Kazuaki Sawada, Makoto Ishida (1.Department of Electrical and Electronic Engineering Toyohashi University of Technology)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-5-4] A New Well Capacity Adjusting Scheme for High Sensitivity, Extended Dynamic Range CMOS Imaging Pixel Sensors

Cheng-Hsiao Lai, Yueh-Ping Yu, Ya-Chin King (1.Microelectronic Laboratory, Semiconductor Technology Application Research (STAR) Group, Department of Electrical Engineering, National Tsing-Hua University)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-7-1] Investigation of Degradation model for Ultra -thin Gate Dielectrics

Hiroko Mori, Hideo Ehara, Naoyoshi Tamura, Chioko Kaneta, Hideya Matsuyama, Ken Shono (1.FUJITSU LSI Quality Assurance Div., 2.FUJITSU Laboratories Ltd.)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-7-2] Thermal Stability of Metal Gate Work Functions

H.Y. Yu, Chi Ren, J.F. Kang, Yee-Chia Yeo, Daniel S.H. Chan, M.F. Li, Dim-Lee Kwong (1.Silicon Nano Device Lab, Dept. of Electrical & Computer Eng., National University of Singapore, 2.Institute of Microelectronics, 3.Dept. of ECE, The University of Texas)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-7-3] Robust TiN/AHO/HSG-Cylinder Capacitor for High Density DRAMs

S.G. Kim, C.S. Hyun, D. Park, H.J. Moon, H.C. Kim, S.J. Kim, T.H. Cho, H.J. Kang, S.M. Jeong, S.W. Lee, S.H. Lee, J.G. Suk, B.K. Lim, Y.S. Jeon, S.G. Jeon, K.Y. Lee, K.S. Oh, W.S. Lee (1.DRAM Process Architecture Team, 2.Fab Team 3, 3.SRAM/Flash Process Architecture Team, Memory Division, Samsung Electronics Co., Ltd.)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-7-4L] Effect of Strain on Static and Dynamic NBTI of pMOSFETs

Hong-Nien Lin, Horng-Chih Lin, Tiao-Yuan Huang, Chih-Hsin Ko, Chung-Hu Ge, C.-C. Lin, Chien-Chao Huang (1.Institute of Electronics, National Chiao-Tung University, 2.National Nano Device Laboratories, 3.Taiwan Semiconductor Manufacturing Company, Ltd.)

2004 International Conference on Solid State Devices and Materials |PDF Download

[A-8-1] Ge and SiGe for High Performance MOSFETs and Integrated Optical Interconnects

Krishna C. Saraswat, Chi On Chui, Tejas Krishnamohan, Ali K. Okyay, Hyoungsub Kim, Paul McIntyre (1.Department of Electrical Engineering, Stanford University, 2.Department of Materials Science and Engineering, Stanford University)

2004 International Conference on Solid State Devices and Materials |PDF Download