[C-8-4] Improved Retention Characteristics of Metal-Ferroelectric-Insulator-Semiconductor Structure Using a Post-Oxygen Annealing Treatment
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
338件中(261 - 270)
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード
2001 International Conference on Solid State Devices and Materials |PDF ダウンロード