Oral presentation

[20a-B303-1~11] 7.2 Applications and technologies of electron beams

Tue. Mar 20, 2018 9:45 AM - 12:45 PM B303 (53-303)

△：奨励賞エントリー
▲：英語発表
▼：奨励賞エントリーかつ英語発表
空欄：どちらもなし

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9:45 AM - 10:00 AM

[20a-B303-1] Lifetime testing of the protrusion-shaped emitter
using agglomerated carbon nanotubes balls under the low vacuum degree

〇Tomohiro Furuzono¹, Hiroshi Furuta^2,3, Takuji Komukai¹, Akimitsu Hatta^2,3 (1.Nitta Corp., 2.Kochi Univ. Technol., System Engineerings, 3.Kochi Univ. Technol., Research Inst.)

10:00 AM - 10:15 AM

[20a-B303-2] Characteristics of nc-Si ballistic electron emitter with a monolayer graphene surface electrode -Enhanced emission efficiency and output electron energy regularity-

〇Akira Kojima¹, Ryutaro Suda¹, Nobuyoshi Koshida¹ (1.Tokyo Univ. A & T)

10:15 AM - 10:30 AM

[20a-B303-3] GOS type Cathode as electron source loaded SEM

〇Joji Miyaji^1,2, Katsuhisa Murakami², Masayoshi Nagao², Yoichiro Neo¹, Hidenori Mimura¹ (1.Shizu Univ., 2.AIST)

10:30 AM - 10:45 AM

[20a-B303-4] Electron emission property of field emitter arrays encapsulated in a small vessel under gamma-ray irradiation

〇(M1)Teruyuki Morito¹, Yasuhito Gotoh¹, Masayoshi Nagao², Nobuhiro Sato¹, Masafumi Akiyoshi³, Ikuji Takagi¹, Tamotsu Okamoto⁴ (1.Kyoto Univ., 2.AIST, 3.Osaka Pref. Univ, 4.NIT Kisarazu College)

10:45 AM - 11:00 AM

[20a-B303-5] Development of Graphene-Oxide-Semiconductor Planar-Type Electron Sources with High Emission Efficiency for Micro Ion Engines

〇(B)Ryo Furuya¹, Katsuhisa Murakami², Masayoshi Nagao², Yoshinori Takao¹ (1.YNU, 2.AIST)

11:00 AM - 11:15 AM

[20a-B303-6] Simulation for Electron Emission from Laser-Irradiated Pyroelectric Crystal

Tenta Komatsu¹, 〇Fujio Wakaya¹, Satoshi Abo¹, Mikio Takai¹, Tomoaki Masuzawa², Hidenori Mimura² (1.Osaka Univ., 2.Shizuoka Univ.)

11:30 AM - 11:45 AM

[20a-B303-7] Improvement of a number of active tips and emission measurements from individual tips in volcano-structured Spindt-type field emitter arrays

Kodai Taguchi^1,2, Hidetoshi Shinya¹, 〇Hidekazu Murata¹, Eiji Rokuta¹, Hiroshi Shimoyama¹, Masayoshi Nagao², Katsuhisa Murakami² (1.Meijo Univ., 2.AIST)

11:45 AM - 12:00 PM

[20a-B303-8] Deflection sensitivity of self-sensing cantilever using electron-beam-deposited Pt

Kenta Kashida¹, 〇Fujio Wakaya¹, Katsuhisa Murakami², Hayato Yamashita^1,3, Yuji Miyato¹, Satoshi Abo¹, Masayuki Abe¹ (1.Osaka Univ., 2.AIST, 3.JST PRESTO)

12:00 PM - 12:15 PM

[20a-B303-9] Development of X-ray microscope equipped with a liquid Li electron source -Improvement of X-ray intensity by modification of electron optical system-

〇Shinichiro Ohta¹, Shigekazu Nagai¹, Tatsuo Iwata¹, Koichi Hata¹ (1.Mie Univ.)

12:15 PM - 12:30 PM

[20a-B303-10] Spatial resolution of electrostatic divergent lens with extremely short focal length

〇(M1)Saba Maeda¹, Yasuhito Gotoh¹ (1.Kyoto Univ.)

12:30 PM - 12:45 PM

△ [20a-B303-11] Evaluation of HPPMS process with Kr discharge gas
for the fabrication of Spindt emitter cathod

〇Hyuga Taniguchi¹, Takeo Nakano¹, Kei Oya¹, Masayoshi Nagao², Hisashi Ohsaki², Katsuhisa Murakami² (1.Seikei Univ., 2.AIST.)

Oral presentation

[20p-B303-1~8] 7.2 Applications and technologies of electron beams

Tue. Mar 20, 2018 2:00 PM - 4:15 PM B303 (53-303)

Tadahiro Kawasaki(JFCC), Mitsunori Kitta(AIST)

△：奨励賞エントリー
▲：英語発表
▼：奨励賞エントリーかつ英語発表
空欄：どちらもなし

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2:00 PM - 2:15 PM

[20p-B303-1] [Young Scientist Presentation Award Speech] TEM Observation of Gold Colloidal Solution with Graphene Sandwiched Structure

〇Yuki Sasaki¹, Tadahiro Kawasaki¹ (1.JFCC)

2:15 PM - 2:30 PM

△ [20p-B303-2] Localized electric field visualization using low energy electron beam deflection

〇(M1)Samuel Jeong¹, Yu Kikuchi¹, Yoshikazu Ito¹, Jun-ichi Fujita¹ (1.Univ. Tsukuba)

2:30 PM - 2:45 PM

[20p-B303-3] Localized electric field visualization technique with offset HAADF STEM

〇(B)Yu Kikuchi¹, Samuel Jeong¹, Yoshikazu Ito¹, Jun-ichi Fujita¹ (1.Tsukuba Univ.)

2:45 PM - 3:00 PM

[20p-B303-4] Development of electrostatic Cs-corrector for SEM using annular and circular electrodes

〇Tadahiro Kawasaki¹, Ryuji Yoshida¹, Takeharu Kato¹, Shunichi Motomura², Tsunenori Nomaguchi², Toshihide Agemura², Masahiro Tomita³, Takashi Ikuta⁴ (1.JFCC, 2.Hitachi High-Tech., 3.Vac. Device, 4.OECU)

3:15 PM - 3:30 PM

△ [20p-B303-5] REELS measurement of negative electrode of Li-ion battery using Auger electron spectroscopy

〇Konomi Ikita¹, Noboru Taguchi², Akihiro Tanaka¹, Riki Kataoka², Yasushi Maeda², Shingo Tanaka², Masahide Shima¹, Kenichi Tsutsumi¹ (1.JEOL Ltd., 2.AIST)

3:30 PM - 3:45 PM

[20p-B303-6] High spatial coherence due to low beam emittance of NEA semiconductor photocathode in SP-TEM

〇Makoto Kuwahara^1,2, Hidefumi Asano², Toru Ujihara^1,2, Nobuo Tanaka¹, Koh Saitoh^1,2 (1.IMaSS, Nagoya Univ., 2.Dept. Eng., Nagoya Univ.)

3:45 PM - 4:00 PM

[20p-B303-7] Noise reduction of electron holograms using dual-tree complex wavelet transform and hidden Markov model

〇Yoshihiro Midoh¹, Koji Nakamae¹ (1.Osaka Univ.)

4:00 PM - 4:15 PM

[20p-B303-8] Characterization of the electron beam damage of lithium titanium oxides by analytical
transmission electron microscopy.

〇Mitsunori Kitta¹, Shingo Tanaka¹ (1.AIST)

Sessions

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[20a-B303-1~11] 7.2 Applications and technologies of electron beams

[20a-B303-1] Lifetime testing of the protrusion-shaped emitter
using agglomerated carbon nanotubes balls under the low vacuum degree

[20a-B303-2] Characteristics of nc-Si ballistic electron emitter with a monolayer graphene surface electrode -Enhanced emission efficiency and output electron energy regularity-

[20a-B303-3] GOS type Cathode as electron source loaded SEM

[20a-B303-4] Electron emission property of field emitter arrays encapsulated in a small vessel under gamma-ray irradiation

[20a-B303-5] Development of Graphene-Oxide-Semiconductor Planar-Type Electron Sources with High Emission Efficiency for Micro Ion Engines

[20a-B303-6] Simulation for Electron Emission from Laser-Irradiated Pyroelectric Crystal

[20a-B303-7] Improvement of a number of active tips and emission measurements from individual tips in volcano-structured Spindt-type field emitter arrays

[20a-B303-8] Deflection sensitivity of self-sensing cantilever using electron-beam-deposited Pt

[20a-B303-9] Development of X-ray microscope equipped with a liquid Li electron source -Improvement of X-ray intensity by modification of electron optical system-

[20a-B303-10] Spatial resolution of electrostatic divergent lens with extremely short focal length

△ [20a-B303-11] Evaluation of HPPMS process with Kr discharge gas
for the fabrication of Spindt emitter cathod

[20p-B303-1~8] 7.2 Applications and technologies of electron beams

[20p-B303-1] [Young Scientist Presentation Award Speech] TEM Observation of Gold Colloidal Solution with Graphene Sandwiched Structure

△ [20p-B303-2] Localized electric field visualization using low energy electron beam deflection

[20p-B303-3] Localized electric field visualization technique with offset HAADF STEM

[20p-B303-4] Development of electrostatic Cs-corrector for SEM using annular and circular electrodes

△ [20p-B303-5] REELS measurement of negative electrode of Li-ion battery using Auger electron spectroscopy

[20p-B303-6] High spatial coherence due to low beam emittance of NEA semiconductor photocathode in SP-TEM

[20p-B303-7] Noise reduction of electron holograms using dual-tree complex wavelet transform and hidden Markov model

[20p-B303-8] Characterization of the electron beam damage of lithium titanium oxides by analytical
transmission electron microscopy.

Authentication

Sessions

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[20a-B303-1~11] 7.2 Applications and technologies of electron beams

△ [20a-B303-11] Evaluation of HPPMS process with Kr discharge gasfor the fabrication of Spindt emitter cathod

[20p-B303-1~8] 7.2 Applications and technologies of electron beams

△ [20p-B303-2] Localized electric field visualization using low energy electron beam deflection

△ [20p-B303-5] REELS measurement of negative electrode of Li-ion battery using Auger electron spectroscopy

Authentication

△ [20a-B303-11] Evaluation of HPPMS process with Kr discharge gas
for the fabrication of Spindt emitter cathod