The Japan Society of Applied Physics

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[P5-8] Improvement of AlGaN/GaN Heterostructure Field Effect Transistor Characteristics by Using Two-step Ohmic Contact Process

Dong-Hyun Cho、Mitsuaki Shimizu、Toshihide Ide、Byoungrho Shim、Hajime Okumura (1.National Institute of Advanced Industrial Science and Technology (AIST), Power Electronics Research Center (PERC)、2.R&D Association for Future Electron Devices (FED), Advanced Power Device Laboratory、3.Ultra-Low-Loss Power Device Technology Research Body (UPR))

2002 International Conference on Solid State Devices and Materials |PDF ダウンロード

428件中(251 - 260)