[A-3-1] Dopant and Potential Profiling with Atomic Resolution by Scanning Tunneling Microscopy (Invited)
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
587件中(11 - 20)
[A-3-2] 1-nm Spatial Resolution in Carrier Mapping of Ultra-Shallow Junctions by Scanning Spreading Resistance Microscopy
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
[A-3-3] Carrier Density Mapping of Small n-MOSFET Devices by Vacuum-gap Modulation Scanning Tunneling Spectroscopy
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
[A-3-4] Trap Generation in Sc2O3/La2O3 High-κ Gate Stack by Nanoscale Electrical Stress
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
[A-5-1] Defect Profiling and the Role of Nitrogen in Lanthanum Oxide-capped High-κ Dielectrics for nMOS Applications
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
[A-5-2] Chemical Bonding-Induced Dipole at the HfO2/Si Interface
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
[A-5-3] Photoemission Study of Chemical Bonding Features and Electronic States of Ultrathin HfTixOy/Pt System
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
[A-6-1] Self-limiting Growth Behavior of Epitaxial NiSi2 and its Impact on Controlled Silicidation of Metal Source/Drain in Silicon Nanowire MOSFETs
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
[A-6-2] Low Temperature Phosphorus Segregation at NiGe/Ge Interface by "Snowplow" Effect
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード
[A-6-3] Formation of Low Resistive S/D-Extension using Carborane Molecular Ion Implantation for Sub-45-nm PMOSFET
2008 International Conference on Solid State Devices and Materials |PDF ダウンロード