[P-13-2] Analysis of Bottom Channel Effect in Silicon Nanowire FET based on Bulk-Silicon: Reduction of Parasitic Capacitance caused by SiGe layer
2011 International Conference on Solid State Devices and Materials |PDF Download
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2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download
2011 International Conference on Solid State Devices and Materials |PDF Download