[F-1-5] A New Method to Effectively Separate PBTI-induced Shallow and Deep Energy Traps in a 28nm High-k Metal-Gate MOSFET
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
540件中(141 - 150)
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード
2014 International Conference on Solid State Devices and Materials |PDF ダウンロード