The Japan Society of Applied Physics

591件中(401 - 410)

[P-1-15] Reduced Interfacial Layer Thickness and Gate Leakage Current of ALD Grown HfAlO with TaN Gates using Chemical Oxides and Spike-Annealing

Yao-Jen Lee、Bo-An Tsai、Hsin-Yi Peng、Charles Pei-Jer Tzeng、Kuei-Shu Chang-Liao (1.National Nano Device Laboratories、2.Department of Engineering and System Science, National Tsing Hua University、3.Electronics Research & Service Organization, Industrial Technology Research Institute)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-1-16] Full Range Work Function Modulation by Nitrogen Incorporation in Hf-Mo Binary Alloys Gate Electrode

Chao-Sung Lai、Chin-Wei Huang、Hsing-Kan Peng、Chih-Hsin Chen、Yu-Ching Fang、Li Hsu、Hui-Chun Wang、Chung-Yuan Lee、Shian-Jyh Lin (1.Department of Electronic Engineering, Chang Gung University、2.Chung-Shan Institute of Science & Technology Materials & Electro-Optics Research Division、3.Nanya Technology Corporation)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

591件中(401 - 410)