[P-3-6] Impact of Gate Overlap on the Performance of Schottky Barrier MOSFETs including GIBL Effect

L. Zeng、Z.L. Xia、G. Du、J.F. Kang、R.Q. Han、X.Y. Liu (1.Institute of Microelectronics, Peking University)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-7] SiGe Recessed Source-Drain (RSD) Stressors for PMOS: Effect of Device Integration Flow and Increased Ge Content on Electrical Performance

V. Machkaoutsan、P. Verheyen、P. Tomasini、G. Eneman、R. Loo、P. Absil、S.G. Thomas、J.P. Lu、J.W. Weijtmans、R. Wise (1.ASM Belgium N.V.、2.IMEC、3.ASM America Inc.、4.Catholic University of Leuven、5.Fund for scientific research Flanders、6.Texas Instruments assignee to IMEC、7.Texas Instruments)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-8] Combined Effects of an Epitaxial Ge Channel and Si Substrate on Ge-on-Si MOS Capacitors and Field Effect Transistors

Jungwoo Oh、Prashant Majhi、Hideok Lee、Se-Hoon Lee、Sanjay Banerjee、Pankaj Kalra、Rusty Harris、Hsing-Huang Tseng、Raj Jammy (1.SEMATECH、2.University of Texas at Austin、3.University of California at Berkeley、4.Chungnam National University Korea)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-9] Investigation of Impact Ionization in Strained-Si nMOSFETs

Ting-Kuo Kang、Yu-Huan Sa、Po-Chin Huang、San-Lein Wu、Shoou Jinn Chang (1.Department of Electronic Engineering, Cheng Shiu University、2.Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-10] Impact of strain on ballistic current in Si n-i-n structures

Hideki Minari、Nobuya Mori (1.Department of Electronic Engineering, Osaka University)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-11] Effect of STI Stress Enhanced Boron Diffusion on Leakage and Vcc_min of Sub-65nm node Low-Power SRAM

Tung-Hsing Lee、Yean-Kuen Fang、Tony Lin、Elrick Hsu、Tzermin Sheng、Chien-Li Kuo、Osbert Cheng、S C Chien (1.VLSI technology Lab., Institute of Microelectronics, EE Department, National Cheng Kung University、2.United Microelectronics Corporation, Central R&D Division)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-12] Impacts of SiN Deposition Conditions on NMOSFETs

Ching-Sen Lu、Kai-Hsiang Chan、Horng-Chih Lin、Tiao-Yuan Huang (1.Institute of Electronics, National Chiao Tung University、2.National Nano Device Laboratories)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-13] The Effect of Etch Stop Layer Stress on Negative Bias Temperature Instability of Deep Submicron p-MOSFETs

Ming Shing Chen、Y. K. Fang、T.H Lee、C.T. Lin、Joe Ko、Yau Kae Sheu、Tsong Lin Shen、Wen Yi Liao (1.Institute of Microelectronics, National Cheng Kung University、2.United Microelectronics Corporation (UMC), Specialty Technology Division)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-14] New Observation of NBTI Degradation and Recovery Effect of Plasma Nitrided Oxide in Nano Scale PMOSFET’s

In-Shik Han、Hee-Hwan Ji、Tae-Gyu Goo、Ook-Sang You、Won-Ho Choi、Min-Ki Na、Ga-Won Lee、Yong-Goo Kim、Sung-Hyung Park、Heui-Seung Lee、Young-Seok Kang、Dae-Byung Kim、Hi-Deok Lee (1.Dept. of Electronics Engineering, Chungnam National University、2.Magnachip Semiconductor Inc.)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P-3-15] Enhanced NBTI Degradation by SMT in Short-Channel pMOSFET

Chen-Shuo Huang、Po-Tsun Liu、Peng-Soon Lim、Chi-Chun Chen、H.J. Tao、Y.J. Mii (1.Institute of Electro-Optical Engineering, National Chiao Tung University、2.Department of Photonics and Display Institute, National Chiao Tung University、3.Taiwan Semiconductor Manufacturing Company)

2007 International Conference on Solid State Devices and Materials |PDF ダウンロード