[PS-6-08] Improved Electrical Stability of Thin-Film Transistors with Co-sputtered Ti-IGZO Channel and Zr0.85Si0.15O2 Gate Dielectric
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
763 results (421 - 430)
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017
2017 International Conference on Solid State Devices and Materials
|Thu. Sep 21, 2017