The Japan Society of Applied Physics

533件中(431 - 440)

[P4-9] Effects of Voltage Cycling on Polarization and Reliability of 3D SBT Ferroelectric Capacitors Integrated in 0.18μm CMOS Technology.

Dirk J. Wouters、Ludovic Goux、Judit Lisoni、David Maes、Hans Vander Meeren、Vasile Paraschiv、Luc Haspeslagh、Cesare Artoni、Giuseppina Corallo、Raffaele Zambrano (1.IMEC, Silicon Process and Device Technology Division、2.STMicroelectronics, Memory Products Group)

2005 International Conference on Solid State Devices and Materials |PDF ダウンロード

[P4-10] Fabrication and Evaluation of Magnetic Tunnel Junction with MgO Tunneling Barrier

Takeshi Sakaguchi、Hoon Choi、Takeaki Sugimura、Mikihiko Oogane、Hyuckjae Oh、Jun Hayakawa、Shoji Ikeda、Young Min Lee、Takafumi Fukushima、Terunobu Miyazaki、Hideo Ohno、Mitsumasa Koyanagi (1.Department of Bioengineering and Robotics, Tohoku University、2.Department of Applied Pyhsics, Tohoku University、3.Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, Tohoku University、4.Hitachi, Ltd., Advanced Research Laboratory)

2005 International Conference on Solid State Devices and Materials |PDF ダウンロード

533件中(431 - 440)