[D-1-5] An Evidence for Ballistic Transport in Nanocrystalline Porous Silicon Layer by Time-of-Flight Measurements
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード
2000 International Conference on Solid State Devices and Materials |PDF ダウンロード