[C-8-4] Direct evidence of localized states in high-k materials for gate insulator - Cathode luminescence study of HfO2 films -
2002 International Conference on Solid State Devices and Materials |PDF Download
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2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download
2002 International Conference on Solid State Devices and Materials |PDF Download