The Japan Society of Applied Physics

734 results (11 - 20)

[A-2-01(Invited)] Experimental Demonstration of Negative Capacitance epi-Ge/Si FETs with Ferroelectric Hf-based Oxide Gate Stack for Swing Sub-60mV/dec and Hysteresis-Free

M. H. Lee1, P. G. Chen1,2, C. Liu3, K. T. Chen4, M. J. Xie1, S. N. Liu1, H. H. Chen1, C. H. Tang1, J. W. Lee1, W. H. Tu2, K. S. Li5, M. C. Chen5, M. H. Liao2, C. Y. Chang3,6, C. H. Cheng1, S. T. Chang4, C. W. Liu2 (1.National Taiwan Normal Univ.(Taiwan), 2.National Taiwan Univ.(Taiwan), 3.NCTU(Taiwan), 4.National Chung Hsing Univ.(Taiwan), 5.National Nano Device Lab.(Taiwan), 6.Academia Sinica(Taiwan))

2016 International Conference on Solid State Devices and Materials |Tue. Sep 27, 2016 3:40 PM - 4:10 PM |PDF Download

[A-3-03] On the Drain Bias Dependence of Tunnel FETs

K. Fukuda1, T. Mori1, H. Asai1, J. Hattori1, W. Mizubayashi1, Y. Morita1, H. Fuketa1, S. Migita1, H. Ota1, M. Masahara1, K. Endo1, T. Matsukawa1 (1.AIST(Japan))

2016 International Conference on Solid State Devices and Materials |Wed. Sep 28, 2016 10:20 AM - 10:40 AM |PDF Download

734 results (11 - 20)