[P-3-16] Effects of hot carriers on DC and RF performances of deep submicron PMOSFET for low-power and high frequency applications

Mao-Chyuan Tang, Yean-Kuen Fang, David Chen, C S Yeh, S C Chien (1.VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Central R & D Division, United Microelectronics Corp.)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-17] NBTI-Stress Induced Grain-Boundary Degradation in Low-Temperature Poly-Si Thin-Film Transistors

Chih-Yang Chen, Ming-Wen Ma, Wei-Cheng Chen, Hsiao-Yi Lin, Kuan-Lin Yeh, Shen-De Wang, Tan-Fu Lei (1.Institute of Electronics, National Chiao Tung University, 2.Toppoly Optoelectronics Corp.)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-18] Investigation of Random Dopant Fluctuation for Multi-Gate MOSFETs Using Analytical Solution of 3-D Poisson’s Equation

Yu-Sheng Wu, Pin Su (1.Department of Electronics Engineering, National Chiao Tung University)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-19] Accurate Extraction of Mobility, Effective Channel Length, and Source/Drain Resistance in 60 nm MOSFETs

Junsoo Kim, Jaehong Lee, Yeonam Yun, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin (1.Nano Systems Institutes, and School of EE, Seoul National University)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-20] Determining the Gate-Finger Width for the Minimum Gate Resistance in RF MOSFETs

Yongsang Jeong, In Man Kang, Jeahong Lee, Hyungcheol Shin (1.Semiconductor Materials and Devices Laboratory Seoul National University, Dept. of Electronics. School of Eng.)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-21] Non-Quasi-Static Small-Signal Model of RF MOSFETs Valid up to 110 GHz

In Man Kang, Yeonam Yoon, Jong Duk Lee, Hyungcheol Shin (1.School of Electrical Engineering, Seoul National University)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-22] Spatial Distribution of Channel Thermal Noise in Short-Channel MOSFETs

Jongwook Jeon, Yeonam Yun, Byug-Gook Park, Jong Duk Lee, Hyungcheol Shin (1.School of Electrical Engineering, Seoul National University)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-23] Impacts of Body Contact Structures on SOI NMOSFET DC, RF, and 1/f Noise Characteristics

Rong Yang, Yong Zhong Xiong, J. L. Shi, H. Qian, J. F. Li, J. Fu, W. Y. Loh, M. B. Yu, G. Q. Lo, N. Balasubramanian, D. -L. Kwong (1.Institute of Microelectronics, 2.Institute of Microelectronics, Chinese Academy of Sciences)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-24] Mechanism and Reliability Index of Hot-Carrier Degradation in LDMOS Transistors

Kuen-Shiuan Tian, Jone F. Chen, Wei-Chieh Wang, Shiang-Yu Chen, Kuo-Ming Wu, J. R. Lee, C. M. Liu, S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Taiwan Semiconductor Manufacturing Company)

2007 International Conference on Solid State Devices and Materials |PDF Download

[P-3-25] Anomalous Hot-Carrier-Induced On-Resistance Degradation in High-Voltage LDMOS Transistors

Shiang-Yu Chen, Jone F. Chen, Kuo-Ming Wu, J. R. Lee, C. M. Liu, S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Taiwan Semiconductor Manufacturing Company)

2007 International Conference on Solid State Devices and Materials |PDF Download

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