[E-3-4L] Characteristic Sensitivity of Multi-Gate and Multi-Fin MOSFETs to Random Dopant Fluctuation and Implication for Digital Circuits
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
707件中(131 - 140)
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード
2009 International Conference on Solid State Devices and Materials |PDF ダウンロード