[P-3-19] Characterization of RF LDMOS Transistors with Different Layout Structures

Hsin-Hui Hu, Kun-Ming Chen, Guo-Wei Huang, Chun-Yen Chang, Yii-Chian Lu, Yu-Chi Yang, Eric Cheng (1.Department of Electronics Engineering, National Chiao Tung University, 2.National Nano Device Laboratories, 3.United Microelectronics Corporation)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-3-20] Combined Negative Bias Temperature Instability and Hot Carrier Stress Effects in Low Temperature Poly-Si Thin Film Transistors

Chih-Yang Chen, Jam-Wem Lee, Wei-Cheng Chen, Hsiao-Yi Lin, Kuan-Lin Yeh, Po-Hao Lee, Ming-Shan Shieh, Shen-De Wang, Tan-Fu Lei (1.Institute of Electronics, National Chiao Tung University, 2.National Nano Device Laboratory, 3.Toppoly Optoelectronics Corp.)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-3-21] N-Type Extended Drain Silicon Controlled Rectifier ESD Protection Device with High Latchup Immunity for High Voltage Operating I/O Application

Yong-Jin Seo, Kil-Ho Kim (1.Department of Electrical and Electronics Engineering, Daebul University, 2.Technology & Product Development Center, MagnaChip Semiconductor Ltd.)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-3-22] Strain Efficiency Enhancement with Stress Intermedium Engineering (SIE) for Sub-65nm CMOS Scaling

Hung-Ming Chen, Chien-Chao Huang, Jiunn-Ren Hwang, Chang-Yun Chang, Yi-Ming Sheu, Ming-Yi Yang, Cheng-Kuo Wen, Shih-Chang Chen, Han-Jan Tao, Fu-Liang Yang (1.Taiwan Semiconductor Manufacturing Company)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-3-23] Empirical Model of Phonon-Limited Electron Mobility for Ultra-Thin Body SOI　MOSFET

Tsuyoshi Yamamura, Shingo Sato, Yasuhisa Omura (1.Graduate School of Eng, Kansai University)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-3-24] Re-examination of 1/f Noise in FD-SOI for Practical Usage of Analog Circuits

Anil Kumar, Yasuhiro Domae, Noriyuki Miura, Tomohiro Okamura, Hirotaka Komatsubara, Yukihiro Kita, Jiro Ida (1.Semiconductor R&D Division, Oki Electric Industry Co. Ltd.)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-3-25] Ultra-Narrow Silicon Nanowire (～3 nm) Gate-All-Around MOSFETs

N. Singh, Y.F. Lim, S. C. Rustagi, L.K. Bera, A. Agarwal, G. Q. Lo, N. Balasubramanian, D.-L. Kwong (1.Institute of Microelectronics)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-3-26] Hot-Carrier Reliability Improvement in Submicron High-Voltage DMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu, Yan-Kuin Su, H. C. Wang, Y. C. Lin, S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Taiwan Semiconductor Manufacturing Company)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-3-27L] Prominent Study on Si Substrate EM Loss and Suppressing Techniques

Chih-Yuan Lee, Joseph Der-Sheng Deng, Jing-Xiang Ye, Chuan-Yu Wang, Chin-Hsing Kao (1.Semiconductor Laboratory, Dept. of Applied Physics, Chung Cheng Institute of Technology, National Defense Univ., 2.Electric Systems Research Division, Chung-Shang Institute of Science and Technology)

2006 International Conference on Solid State Devices and Materials |PDF Download

[P-4-1] Technology of Ferroelectric Thin Film Formation with Large Coercive Field for Future Scaling Down of Ferroelectric Gate FET Memory Device

Ichirou Takahashi, Tatsunori Isogai, Keita Azumi, Masaki Hirayama, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (1.Graduate School of Engineering, Tohoku University)

2006 International Conference on Solid State Devices and Materials |PDF Download

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