The Japan Society of Applied Physics

734 results (31 - 40)

[B-1-03] A Sidewall Electrode TiOx/TiOxNy ReRAM with Excellent Memory Window Control and Reliability Using Plasma Oxidation and a Novel Degradation-detecting Writing Algorithm

D. Lee1, J. Wu1, M. Lee1, E. Lai1, W. Khwa1, Y. Lin1, W. Chen1, K. Chiang1, T. Wang1, S. Horng2, J. Gong2, H. Lung1, K. Hsieh1, C. Lu1 (1.Macronix International Co., Ltd.(Taiwan), 2.National Tsing Hua Univ.(Taiwan))

2016 International Conference on Solid State Devices and Materials |Tue. Sep 27, 2016 2:20 PM - 2:40 PM |PDF Download

734 results (31 - 40)