The Japan Society of Applied Physics

734 results (21 - 30)

[A-6-01(Invited)] Bias Temperature Instability in Tunnel FETs

W. Mizubayashi1, T. Mori1, K. Fukuda1, Y. Ishikawa1, Y. Morita1, S. Migita1, H. Ota1, Y. X. Liu1, S. O'uchi1, J. Tsukada1, H. Yamauchi1, T. Matsukawa1, M. Masahara1, K. Endo1 (1.AIST(Japan))

2016 International Conference on Solid State Devices and Materials |Thu. Sep 29, 2016 11:15 AM - 11:45 AM |PDF Download

734 results (21 - 30)