[P4-9] Effects of Voltage Cycling on Polarization and Reliability of 3D SBT Ferroelectric Capacitors Integrated in 0.18μm CMOS Technology.
2005 International Conference on Solid State Devices and Materials |PDF Download
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2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download
2005 International Conference on Solid State Devices and Materials |PDF Download