[L-2-6] Leakage Current Suppression Using Passivation of Defect by Anodic Oxidation for 4H-SiC Schottky Contacts
2012 International Conference on Solid State Devices and Materials |PDF Download
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2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download
2012 International Conference on Solid State Devices and Materials |PDF Download