[P-1-20L] Novel Gadolinium Oxide Nanocrystals with Hafnium Oxide Trapping Layer Nonvolatile Memory Using Al2O3/SiO2 Dual Tunneling Layers
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
741件中(481 - 490)
[P-2-1] Direct wafer bonding technology of 300mm wafer
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
[P-2-2] Thinning Process Induced Surface Defects in Ultra-Thin Si Wafer
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
[P-2-3] Mn2O3 Slurry Reuse for SiO2 Film CMP
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
[P-2-4] Optimum Design of MEMS Resonator Array to Measure the Young's Modulus of Nano-Scale Thin Films for the Reliability of Semiconductor Devices
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
[P-2-5] A New Technique for in-Plane Poisson's Ratio Measurement of Thin Films - Cases of Single-Crystal Silicon and Aluminum Thin Films -
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
[P-2-6] Evolution of Wafer Shape and Localized Stress of Silicon Surrounded by Through Silicon Via Patterns along Various Process Integration Steps
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
[P-2-7] Improvement of the BCB Adhesion on Cr/Au Metal Layer for RF Packaging Module
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
[P-2-8] Testkey Design of Through Silicon Vias (TSVs) for Accurate De-embedding and RF Model Parameters Extraction
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード
[P-2-9] Study of Local Charging Phenomena during SiO2 Contact Hole Etching
2011 International Conference on Solid State Devices and Materials |PDF ダウンロード